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The Chotest SJ5760-PR is a high-precision, direct-contact profilometer designed for comprehensive surface contour and roughness measurements. It is particularly suited for applications requiring detailed analysis of complex geometries in industrial and laboratory settings.

The Chotest SJ5720-OPT100 is a high-precision 2D profilometer specifically designed for measuring surface roughness and profiles of optical components. It is particularly suited for applications involving aspheric lenses, intraocular lens molds, vehicle lenses, infrared lenses, and other precision optical molds.

The Chotest SJ5720-OPT200 is a high-precision 2D profilometer tailored for measuring surface roughness and profiles of large optical components. It is particularly suited for applications involving aspheric lenses, intraocular lens molds, vehicle lenses, infrared lenses, and other precision optical molds.

Model: Omnia Tap 6-12/UV/UV-UF The OmniaTap system is the choice when a small amount of both pure and ultrapure water is needed. It combines a compact size with high flexibility and can be directly connected to a tap water source. The standard OptiFill dispenser allows for one-handed operation of the system and monitors all quality parameters.

The Raman Imaging Microscope – alpha300 R is an advanced instrument that integrates optical microscopy with Raman spectroscopy technology, offering exceptional performance in sensitivity, resolution, and speed. This system enables hyperspectral imaging with complete Raman spectral information at every pixel, making it ideal for 3D imaging and depth profiling. Equipped with an optimized optical system and UHTS (Ultra-High Throughput Spectrometer) designed for low-light intensity applications, this microscope provides a non-destructive and highly precise solution for demanding research without compromising the integrity of the sample.

The Raman-SEM microscope is the world’s first fully integrated system combining Raman spectroscopy and Scanning Electron Microscopy (SEM) in a single instrument. With its novel correlative microscopy approach, RISE merges the ultrastructural surface analysis capability of SEM with molecular compound information from confocal Raman imaging. The system enables seamless switching between Raman and SEM measurements, supported by a user-friendly software interface for intuitive control. The RISE microscope not only maintains the full performance of both techniques but also provides precise correlation between the measurement results.

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

CME’s standard and customized products allow the simulation of the most diverse environmental condition. Among wide range of customized solutions, MIL standard Thermal shock chamber is one which is customized to test various products for continuous environmental changes from extremely high to low temperature within a short time frame.