The EDX-B3T/B6T Coating Thickness XRF is specially designed for analyzing coating composition and accurately measuring coating thickness. The system irradiates the sample with X-rays and determines coating thickness by measuring the intensity of secondary X-rays emitted from the sample, enabling completely non-destructive analysis. Key advantages include high accuracy, fast measurement, non-destructive testing, and easy operation. It can simultaneously measure the thickness of up to five coating layers and quickly identify the composition of coating materials, making it an efficient solution for coating analysis and quality control.
This series are primarily utilized for material elemental composition analysis across all stages of complete mining process.
The A Series MICRO XRF is designed for precise measurement of the smallest X-ray features in semiconductors and microelectronics. The system supports large PCBs and wafers of any size, with a 7.5 μm FWHM X-ray beam—the smallest in the world for XRF. A dual-camera system with 140X magnification provides detailed imaging, while a programmable X-Y stage moves up to 600 mm with ±1 μm precision. Pattern recognition, auto-focus, and 3D mapping optimize measurement accuracy.
The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.
Nieka Core 6 – Fusion Machine for XRF and ICP The Core-6 is the achievement of a decade-long research program where nothing has been left behind. With the Core systems, you will benefit from multiple inventions and the experience of Nieka users worldwide. The Core-6 mechanical systems are based on the proven Nieka platform: they...
Sample Preparation
Nieka E Series – Fusion Machine for XRF and ICP Preparation Full temperature range for no-compromise methods – Perfect for ICP and XRF sample preparation The Ultimate electric fusion At NIEKA®, we used our strong experience from the fusion industry and forged an instrument that is the perfect fit for the most demanding industrial fusion...
Sample Preparation
Nieka G Series – Fusion Machine for XRF and ICP Preparation The solution for HIGH-THROUGHPUT FUSION laboratories AT Nieka, we used our strong experience from the fusion industry and forged an instrument that is the perfect fit for the most demanding high throughput fusion laboratories. Downtime is your enemy and using the best tool is...
The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.