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The SuperView WT3000 Hybrid 3D Optical Profilometer by Chotest Technology Inc. is a high-precision instrument designed for detailed surface topography analysis. It integrates multiple optical measurement techniques, including white light interferometry, confocal microscopy, and focus variation, to deliver comprehensive 3D surface measurements.

The SuperView WT3200 Hybrid 3D Optical Profilometer by Chotest Technology Inc. is a high-precision instrument designed for detailed surface topography analysis. It integrates multiple optical measurement techniques, including white light interferometry, confocal microscopy, and focus variation, to deliver comprehensive 3D surface measurements.

The SuperView WX100 is a high-precision white light interferometry probe developed by Chotest Technology Inc., designed for non-contact 3D surface profiling and roughness measurements at the micro- and nano-scale. This compact and versatile instrument is well-suited for applications in semiconductor manufacturing, electronics, optics, and precision engineering.

This advanced thermal conductivity measurement system offers two standardized methods: (1) Vertical (ASTM D5470) for steady-state measurements (0.1–80 W/m·K) using copper pillars, ideal for low-conductivity materials like insulators, and (2) Horizontal (Angström’s Method) for transient measurements (0.1–1,000 W/m·K), suitable for high-conductivity materials like metals. The vertical method requires two sample thicknesses for accuracy but eliminates contact resistance, while the horizontal method uses temperature wave analysis for faster results without thickness constraints. Both methods feature ±0.001°C resolution, automated pressure/positioning controls, and comply with international standards, ensuring precision and reproducibility unmatched by domestic alternatives.