XRF (O SERIES)- BOWMAN

Origin: America

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The O Series combines high performance and ultra-small x-ray spot size (80μm FWHM) using poly-capillary optics, which maximize x-ray flux for higher sensitivity and faster testing of small components or thin coatings. Unlike traditional collimators, this system retains nearly 100% of the tube flux, ensuring superior repeatability in shorter test times. It features a high-resolution SDD detector, 55x video magnification, 7x digital zoom, and a programmable X-Y stage. Due to its close focal distance, samples must be flat. Now available with an extended stage option for greater flexibility.

MODEL: XRF O SERIES

SPECIFICATION

X-ray excitation: 50 W W-target with Capillary Optics @80um FWHM at 17 KeV
Detector: Large window Silicon drifted detector with 190eV resolution or better
Number of analysis layers and elements: 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters/Collimators: 4 primary filters
Output Focal Depth: Fixed at 0.1″ (2.54mm)
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 55X Micro with 7X Digital Zoom
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Working Environment: 68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing
Weight: 52-70kg
Programmable XY: Table size: 330mm (13″) x 381mm (15″)| Travel: 127mm (5″) x 152mm (6″)
Now available with optional extended stages or enclosed chamber
Internal Dimensions: Height: 140mm (5.5″), Width: 305mm (12″), Depth: 330mm (13″)
External Dimensions: Height: 457mm (18″), Width: 457mm (18″), Depth: 610mm (24″)

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