ESS High Ramp Rate Chamber

Origin: India

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Environmental Stress Screening (ESS) chambers simulates stressful environment through rapid thermal cycling to determine the specimen’s failure rate in a shorter testing period. It not only helps manufacturer to develop a better product with least infant mortality rate but also considerably decreases their product development time. CME’s ESS chamber has ramp rate of 20°c/min with humidity range in between 10% to 98% RH forming a highly stressful environment in its test space to conduct wide range of testing procedures. The chamber is widely popular among electronics & electrical industries who relies on our chamber to identify failure risks of their new offerings which are in development stage.

ESS High Ramp Rate Chamber

Environmental Stress Screening (ESS) chambers simulates stressful environment through rapid thermal cycling to determine the specimen’s failure rate in a shorter testing period. It not only helps manufacturer to develop a better product with least infant mortality rate but also considerably decreases their product development time. CME’s ESS chamber has ramp rate of 20°c/min with humidity range in between 10% to 98% RH forming a highly stressful environment in its test space to conduct wide range of testing procedures. The chamber is widely popular among electronics & electrical industries who relies on our chamber to identify failure risks of their new offerings which are in development stage.

 

 

Environmental Stress Screening (ESS) chambers simulates stressful environment through rapid thermal cycling to determine the specimen’s failure rate in a shorter testing period. It not only helps manufacturer to develop a better product with least infant mortality rate but also considerably decreases their product development time. CME’s ESS chamber has ramp rate of 20°c/min with humidity range in between 10% to 98% RH forming a highly stressful environment in its test space to conduct wide range of testing procedures. The chamber is widely popular among electronics & electrical industries who relies on our chamber to identify failure risks of their new offerings which are in development stage.

Description Specification
Workspace Dimensions – WxDxH
mm 500 x 500 x 500
In 20 x 20 x 20
Volume
Ltr 125
Cuft 4
Temperature Range
°C -70 To 200
°F -94 To 392
Ramp Rates
Cooling   °C/min 20
Heating   °C/min 20

Communication

Ethernet

Ethernet capability to remotely monitor and control the chamber.

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USB

USB Type-A host port to connect a keyboard or mouse or download CSV data via pen drive [max 2GB] USB Type-B data port for connection to PC for software upgrade and access memory card storage

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Web Server

Built-in web server allows remote view or control from any internet connected PC, tablet or smart phone

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NI Lab view

The communication which used is MODBUS RTU protocol, which is an international standard for communication in process instrumentation and automation. Necessary changes to be made in the user’s software to communicate this in MODBUS RTU universal protocol. This feature can be used manual mode only.

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Hardware

Hardware

Enhanced with modular controller integrating multi-zone PID control and data acquisition. SIMATIC programmable logic controller. Touch screen controller, PLC and other controller components are of a generic make with an OEM software. Free software upgrades up to one year.

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Memory

SD card of 2GB memory will store all the test program data and also the diagnostic data. This card is accessible by USB and Ethernet.

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Digital Events

1 digital output for switching test specimen via potential free contacts, load max. 24 VDC, 5A

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Programming & Report Generation

Programs

99 independent programs can be stored with name and number. Each of these programs have segments which can be looped to a previous segment and repeated up to 999 cycles, creating almost unlimited number of segments The chamber can be operated in manual mode, where the set point can directly be changed in the home screen The ramp rate can be set as a value in °C/min or ramp time Graphical representation of the temperature program The time is logged only when the set valve is within the band.

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Trend Graph

Real time trend graph for temperature set value, temperature process value, humidity set value and humidity process value. Options of zoom in/out, pan and individual plot selection

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Safety & Security

Security

Multi level security of guest, user, admin and factory level users with individual password protection All settings can be reset to factory defaults using admin login

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PID

6 zone based PID’s with auto recall of PID based on type of program, segment and zone can be set. Each of these PID’s can be set by using the auto tune feature or manually based on user’s requirements.

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Process Mimic

Graphical representation of the working of the chamber, with live status of all the components, including the current temperature/humidity process values, compressor suction/discharge pressures and return gas temperature

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Power Resumption Modes

In case of a power failure, option of conditional restart based on temperature/time or continuous

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Service & Maintenance

Diagnostics
Event viewer will display a log of all errors/actions with a date and time stamp PLC inputs and outputs status will be indicated

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Service Monitor
Log of critical components life cycle with a predefined life cycle time and elapsed time in hours

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Delay Start

Real time clock based, delayed start function

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PRODUCT VIEWED

Environmental Stress Screening (ESS) chambers simulates stressful environment through rapid thermal cycling to determine the specimen’s failure rate in a shorter testing period. It not only helps manufacturer to develop a better product with least infant mortality rate but also considerably decreases their product development time. CME’s ESS chamber has ramp rate of 20°c/min with humidity range in between 10% to 98% RH forming a highly stressful environment in its test space to conduct wide range of testing procedures. The chamber is widely popular among electronics & electrical industries who relies on our chamber to identify failure risks of their new offerings which are in development stage.